臺式雙面電池PID測試儀

更新時間： 2024-03-04
產品型號： PIDcon bifacial
簡單描述
臺式雙面電池PID測試儀用于單面及雙面電池，HIT、Topcon、PERC/PERC+太陽能電池、晶體硅太陽能電池、微型模塊等的質量控制Freiberg公司與德國FraunhoferCSP公司合作開發了一種可作為商業應用的臺式太陽能電池和微型模塊的電勢誘導退控制的測量解決方案

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詳細介紹

雙面電池問題：

將電池的(de)后側改為光蓋，被發現使雙面PERC電池和模塊對后側的(de)新型PID敏感(gan)，即去極化型PID(PID-p)和腐蝕型PID機(ji)制(PID-c)。

解決方案：

為了測(ce)(ce)試電(dian)(dian)池的這些(xie)類(lei)型(xing)的PID，我們開發了PIDcon雙面體。它(ta)是用溫度、照明和(he)高(gao)電(dian)(dian)壓(ya)對完整的電(dian)(dian)池進行壓(ya)力測(ce)(ce)試，它(ta)可(ke)(ke)以(yi)在兩個(ge)方(fang)向上進行極化。通(tong)過測(ce)(ce)量照明下的IV曲線，可(ke)(ke)以(yi)確定PID的靈敏度。

臺式雙面電池PID測試儀應用：

太陽能電池片PID檢(jian)測(ce)

HIT、Topcon 、PERC、AL-BSF、PERC+、雙(shuang)面PERC、PERT、PERL和IBC太陽能(neng)電池(chi)的研究、生(sheng)產和質量控(kong)制。

欲了解更多信息，請訪問 www.pidcon。。ｃｏｍ

臺式雙面電池PID測試儀PIDcon bifacial的特點：

● 符合IEC62804-TS標準

● 易于使用的臺式設備

● 能(neng)夠測量c-Si太陽能(neng)電池(chi)和微型模(mo)塊

● 無需氣候室

● 無需層壓電池

● 測量(liang)速度:小(xiao)時至數天

● 可測量參數:分(fen)流電(dian)(dian)阻、功率(lv)損耗、電(dian)(dian)導率(lv)、漏(lou)電(dian)(dian)流、濕度(du)、溫度(du)

● 太陽(yang)能電池可(ke)以在以后通(tong)過EL等進行(xing)研究

● 基于IP的(de)系統(tong)允許遠(yuan)程操作(zuo)和技術支(zhi)持從世界任何地方

標準試驗條件:

● 電壓:upto1.5kV

● 溫度:85°C

● 測試(shi)時間:4hours(typical)

● 干(gan)燥條件下，不需要水(shui)

類型受壓恢復
PID-s正面 85°C，+1.5 kV 85°C，-1.5 kV

PID-p背(bei)面 85°C，+1.5 kV，無照明 85°C，  暗儲存或光照

PID-c背面 85°C，+1.5 kV，照明不可恢復

層壓 150°C，20min

樣品尺寸(cun) 210×210mm

適用于 A PERC,AL-BSF,IBC,PERC+,雙面PERC,p型和n型電池功率要求 110/230 V AC, 50/60 Hz

資質(zhi)認證根據(ju)ISO9001準則制造(zao)，符合CE標準

參考文獻： cells (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced  degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163

(2)V. Naumann, K. Ilse, M. Pander, J. Tr?ndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic

modules, AIP Conference Proceedings 2147, 090005 (2019).

(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).

(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells

as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.

(5)K. Sporleder, J. Bauer, S. Gro?er, S. Richter, A. H?hnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.

(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. P?blau, S. Gro?er, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.

(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.